V62/03654-01XE

The SN74AHCT08, a quadruple 2-input positive-AND gate, embodies precision and reliability in its design. With a focus on functionality, this device seamlessly executes the Boolean function Y = A • B or Y = (A\ + B\)\ in positive logic. Its efficiency lies in its ability to process input signals, ensuring optimal performance in various electronic systems. Engineers rely on its robustness to deliver consistent results, making it a cornerstone component in modern circuitry

Key Features

• Controlled Baseline
  • One Assembly/Test Site, One Fabrication Site
• Extended Temperature Performance of –55°C to 125°C
• Enhanced Diminishing Manufacturing Sources (DMS) Support
• Enhanced Product-Change Notification
• Qualification Pedigree
• EPIC™ (Enhanced-Performance Implanted CMOS) Process
• Inputs Are TTL-Voltage Compatible
• Latch-Up Performance Exceeds 250 mA Per JESD 17
• ESD Protection Exceeds 2000 V Per MIL-STD-883, Method 3015; Exceeds 200 V Using Machine Model (C = 200 pF, R = 0)

Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.

EPIC is a trademark of Texas Instruments.